System and method for image processing and feature recognition

ABSTRACT

The present invention is directed to systems and methods for processing multi-dimensional image data to isolate specific features within the image data. One exemplary application is non-destructive testing to detect deformation of structures from image data. The methods for isolating salient features includes generating a “baseline” approximation of the surface image by subdividing the image into a network of triangle planes, approximating the measured value for each plane and subtracting the baseline from the original image data to generate a processed image. The process for defining the triangle-plane network, approximating each plane and performing baseline subtraction can yield a final processed image that includes changes in feature value occurring within a particular triangular plane, which can indicate deformation, while changes in feature value occurring over larger areas, which can be a product of environmental and inspection variables, are at least partially removed from the resulting data set.

FIELD OF THE INVENTION

The present invention relates to image processing methodologies and inparticular relates to non-destructive testing systems and methods foranalyzing surface-image data of a structure to identify structuralfeatures including material deformation.

BACKGROUND OF THE INVENTION

Pipeline and vessel structures used in the oil and gas industry areexposed to stresses over time that can accumulate to produce defects inthe structure. Unfortunately, it is typically difficult to determinewhether such structures are being subjected to damaging stresses untileasily observable defects occur.

The availability of non-destructive inspection techniques for structuralmaterials, for instance, nonmetallic pipes used in pipelines, islimited. For the most part, the techniques available so far are eitherdestructive to the material or are experimental and unreliable.Moreover, with respect to the existing image processing systems fordetecting features within an image of an inspected surface typicallyconcentrate on averaging, smoothing and isolating features based onfrequency. Generally, existing non-destructive systems and monitoringtechniques for inspection of materials can be inadequate for efficientlydetecting the presence of stresses on or in the material such as tensilestress or compressive stress with sufficient accuracy and precision suchthat defects can be predicted before they occur.

Surface approximation using computer graphics technologies has beenutilized to process image data sets. There exist several methods ofsurface approximation including, square/rectangle grid approximationthat uses smaller squares to discretize a large surface domain,triangular regular network that uses triangles of the same shape,triangular irregular network that uses triangles of any shape and thelike. However, current computer technologies and algorithms for surfaceapproximation can require massive digital data storage and expensivecomputer hardware because of the complexity of the processingalgorithms, and monitoring systems.

What is needed is a system and method for efficiently detecting featuresfrom surface-image data through computer image processing withsufficient resolution and accuracy. More specifically, an imageprocessing and monitoring system which isolates features and can be usedto quantify material deformation of structures from image data collectedusing optical inspection devices.

It is with respect to these and other considerations that the disclosuremade herein is presented.

SUMMARY OF THE INVENTION

The present invention is directed to a computer implemented method fordetecting deformation of a structure from multi-dimensional image dataof a surface of the structure captured with an optical inspectiondevice.

In one aspect, a computer implemented method for detecting deformationof a structure from multi-dimensional image data of the structurecaptured using an optical inspection device is provided. In particular,the method includes the step of providing the multi-dimensional imagedata of the surface of the structure at a processor, wherein the imagedata comprises a plurality of data-points that are measured using theoptical inspection device. More specifically, each data-pointincludes: 1) location data identifying a respective location on thesurface that a respective data-point was captured in at least twodimensions; and 2) feature value data including at least a respective zvalue for the respective data-point measured using the inspectiondevice. The method also includes the step of applying, with theprocessor, a surface dividing model to the image data. Morespecifically, applying the surface dividing model includes the step ofdividing the surface represented by the image data into multipleparallelogram-shaped planes, and subdividing each of theparallelogram-shaped planes into two triangle planes, respectively. Themethod also includes the step of calculating, with the processor, anapproximate feature value Z for each of the triangle planes. Morespecifically, the feature value for a respective triangle plane iscalculated based on a measured feature value z of one or more of thedata-points within the respective triangle plane. The method alsoincludes the step of calculating, with the processor based on theapproximate feature value Z, an adjusted feature value V for each of theplurality of data-points. More specifically, the adjusted feature valueV for a respective data-point is calculated based on the measuredfeature value z for the respective data-point and the calculatedapproximate feature value Z for a triangle plane that the respectivedata-point is within. The method also includes the step of generating aprocessed multi-dimensional image of the surface in which the data setfor the processed multi-dimensional image differs from the data set inthe provided image data. More specifically, the multi-dimensional imageof the surface is generated with the processor based on the adjustedfeature value V of each data-point. The method also includes the step ofoutputting by the processor on a display, the processedmulti-dimensional image of the surface wherein the processedmulti-dimensional image depicts in a graphical representation thedetected deformation of the surface within a particular triangular planeof the surface dividing model of the image data.

According to another aspect, a system for detecting deformation astructure from multi-dimensional image data of a surface captured withan optical inspection device is provided. The system comprises acomputer readable storage medium, a communication interface and adisplay. The system also comprises one or more processors configured toaccess the storage medium and that are in operative communication withthe communication interface and the display. In addition, the systemincludes software modules that are stored on the storage medium andexecutable by the processor.

The software modules include a communication module that, when executedby the processor, configures the processor to receive themulti-dimensional image data including a plurality of data-points thatwere measured using the optical inspection device. In particular, thedata-points comprise: location data identifying, in at least twodimensions, a respective location on the surface that a respectivedata-point was captured, and feature value data that includes at least arespective feature value z for the respective data-point measured usingthe inspection device.

The software modules also include a surface dividing module that, whenexecuted by the processor, configures the processor to divide thesurface represented by the image data into multiple parallelogram-shapedplanes according to a surface dividing model and also subdivide each ofthe parallelogram-shaped planes into two triangle planes, respectively.

The software modules also include a feature detection module that, whenexecuted by the processor, configures the processor to calculate arespective approximate feature value Z for each of the triangle planes.In particular, the approximate feature value Z for a respective triangleplane is calculated based on a measured feature value v of one or moreof the data-points within the respective triangle plane. In addition,wherein the feature detection module further configures the processor tocalculate an adjusted feature value V for each of the plurality ofdata-points. In particular, the adjusted feature value V for arespective data-point is calculated based on the measured feature valuez for the respective data-point and the calculated approximate featurevalue Z for a triangle plane that the respective data-point is within.

The software modules also include an image generation module that, whenexecuted by the processor, configures the processor to generate, basedon the adjusted feature value V of each data-point, a processedmulti-dimensional image of the surface in which the data set for theprocessed multi-dimensional image differs from the data set in theprovided image data. The image generation module also configures theprocessor to output the processed multi-dimensional image of the surfaceusing the display. More specifically, the processed multi-dimensionalimage depicts in a graphical representation the detected deformation ofthe surface within a particular triangular plane of the surface dividingmodel of the image data.

These and other aspects, features, and advantages can be appreciatedfrom the accompanying description of certain embodiments of theinvention and the accompanying drawing figures and claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic view of an inspection apparatus for capturingmulti-dimensional image data of a structure according to an embodimentof the present invention;

FIG. 2 is a schematic block diagram of components of a computing devicefor analyzing multi-dimensional image data according to an embodiment ofthe present invention;

FIG. 3 is a systematic flowchart illustrating a routine for analyzingmulti-dimensional image data according to an embodiment of the presentinvention;

FIG. 4A is a conceptual diagram illustrating an data structure of imagedata according to an embodiment of the present invention;

FIG. 4B is a graphical representation of surface-image data at variousstages of processing according to an embodiment of the presentinvention;

FIG. 4C is a graphical representation of a triangle-plane network ofsurface-image data according to an embodiment of the present invention;

FIG. 4D is a 3-dimensional graphical representation of a triangle-planeof surface-image data according to an embodiment of the presentinvention;

FIG. 5A is a three-dimensional graphical representation of surface-imagedata comprising observed feature values according to an embodiment ofthe present invention;

FIG. 5B is a three-dimensional graphical representation of approximatedfeature values of the surface-image data of FIG. 5A according to anembodiment of the present invention;

FIG. 5C is a three-dimensional graphical representation of processedsurface-image data overlaid on the graphical representation ofsurface-image data of FIG. 5B according to an embodiment of the presentinvention;

FIG. 5D is a three-dimensional graphical representation of the processedsurface-image data of FIG. 5C according to an embodiment of the presentinvention;

FIG. 5E is a three-dimensional graphical representation of processedsurface-image data overlaid on a triangulated map of surface-image dataaccording to an embodiment of the present invention;

FIG. 5F is a three-dimensional graphical representation of processedsurface-image data of FIG. 5E according to an embodiment of the presentinvention; and

FIG. 5G is an exploded view of three-dimensional graphicalrepresentations of layers of surface-image data processed according toan embodiment of the present invention.

DETAILED DESCRIPTION OF CERTAIN EMBODIMENTS OF THE INVENTION

By way of overview and introduction, the systems and methods disclosedherein relate to computer implemented image processing methodologiesdesigned for “treatment” of images in order to extrapolate, isolate,highlight and quantify specific features within the image data. As anon-limiting example, the disclosed image processing systems and methodscan be applied in non-destructive testing (NDT) systems for inspectingmaterials and detecting deformations in an otherwise generally uniformmaterial structure. Accordingly, while the exemplary systems and methodsare further described herein as being applied in such systems formeasuring deformation of material structures, the application of theexemplary processing algorithms is not so limited, as the algorithms canbe used for processing and feature detection using any variety ofmultidimensional images or, more generally, any multidimensional plot,matrix, or tensor (collectively referred to as an “image” or “imagedata”).

Broadly put, the exemplary methods of treating the multi-dimensionalimage data includes generating a multidimensional “baseline” image andperforming baseline subtraction (i.e., subtracting the baseline from theoriginal image) to generate a processed image. For instance, in anexemplary two dimensional image analysis application, the computerimplemented method configures a computing device processor to generate abaseline surface that is subtracted from the original image for thepurpose of eliminating “long range” variations (e.g., spanning largerareas) from the data-set such that only “sharper” or localized featuresremain, while the remaining data set is flattened. The disclosedembodiments are more specifically described in connection withprocessing three-dimensional image data, namely, three-dimensional plotsof surface-image data captured using an optical inspection device duringNDT inspection of a structure, however, the same procedure can beextended to data sets of higher dimensions as well.

Exemplary structural materials that are configured to facilitate NDTtesting and exemplary inspection devices that can be used to generatethe three-dimensional surface-image datasets are briefly describedherein and further described in co-pending and commonly assigned U.S.patent application Ser. No. 15/082,327, entitled SYSTEMS AND METHODS FORCONSTRUCTING AND TESTING COMPOSITE PHOTONIC STRUCTURES, filed on Mar.28, 2016 and naming inventors Bovero et al.

In general, during NDT testing, an inspection apparatus is positioned soas to emit radiation onto an area of a surface of a structure. Radiationdiffracted from the surface of the structure (and/or from within thestructure) and any periodic features within the structure or on thesurface (e.g., periodic gratings, fluorophore materials, and the like)can be detected using a radiation sensor of the inspection device.Accordingly, using the detected diffracted light, a processing apparatuscan analyze the image data to determine whether the section of thesurface inspected has been subject to deformation.

In order to monitor the condition of large structures in the field, suchas pipelines and storage vessels, materials that facilitate NDT testingcan be integrated, embedded or attached to the structures to act asindicators of structural condition. Such materials can includestructures that undergo a change in an index parameter in response todeformation. One important class of such materials comprises periodicphotonic materials, including optical gratings and photonic crystals.Diffraction patterns transmitted by photonic materials in response toirradiation are extremely sensitive to the periodic spacing of theircomponent elements. Thus, any deformation or perturbation from a norm towhich embedded photonic materials are subjected, due, for example, totensile stress, compressive stress, bending, temperature variations,etc., can be revealed in a corresponding difference in the diffractionpattern of the perturbed structure from the norm. The change indiffraction pattern can be proportional to the size of the perturbationand can be captured and measured using an inspection apparatus.

FIG. 1 shows an exemplary embodiment of an inspection apparatus 100 usedfor inspecting a structure 150 including a photonic material 103 (e.g.,embedded in the structure, not shown). The photonic material 103 cancomprise a diffraction grating but can also comprise other structuresthat exhibit a periodic variation in an optical characteristic, such asrefraction index. Apparatus 100 comprises a housing 105 containing anumber of components used for inspecting the structure that can bepositioned and moved as a unit along a length of the structure. For thispurpose the housing can be coupled to a vehicle, such as a robot ordrone, or alternatively, the housing can include a driving mechanism andwheels for automatic locomotion.

Positioned within housing 105 are radiation sources 110, 115 positionedto direct radiation toward a section of the structure 150 through anopening 107 of the housing. Although two radiation sources are depicted,in some embodiments a single source can be used, and in alternativeembodiments, more than two sources can be used. In an exemplaryimplementation, radiation source 110 is a laser (single wavelength)source and radiation source 115 is a diffused radiation source thatemits a plurality of different wavelengths. The diffused radiationsource 115 can take a wide range of forms and can emit radiation over abroad or narrow range of wavelengths, in the visible and/or outside thevisible spectrum. For example, the diffused radiation source can beimplemented using a white LED, a flash light, an X-ray emitter, ornatural ambient radiation. One or more lenses e.g., 120 can beconfigured to focus the radiation emitted by the diffused radiationsource 110 onto the structure 150 for inspection.

In operation, radiation received at photonic material 103 can bediffracted and reflected back toward the opening 107 of the inspectionapparatus. In some embodiments, apparatus 100 includes a reflector 125(as depicted) positioned so as to receive radiation diffracted fromphotonic material. Reflector 125 and one or more focusing components 128can be oriented to direct and focus the incoming radiation into aradiation sensor 130. Radiation sensor 130 can be implemented innumerous ways including as a digital camera, infrared detector,charge-coupled device (CCD) photomultiplier, photographic film, etc. Inimplementations in which the sensor constitutes a single element, themagnitude or intensity of the signal output by the sensor is used todetermine displacement. For sensors that include an array of elements,such as a CCD array, the response of a particular array element (i.e.,position) provides information from which displacement can bedetermined. In the embodiment depicted, radiation sensor is coupled toand transmits captured sensor data to a local processor 140. Theinspection apparatus 100 can be arranged with various computer hardwareand software components that serve to enable operation of the inspectiondevice and, more specifically, perform operations relating to theanalysis of the information captured by the radiation sensor 130. Inaddition or in alternative embodiments, the apparatus 100 includes acommunication module (e.g., wireless transceiver or other wired orwireless communication interface) for transmitting the sensor data to aremotely-based computing device for further processing of the capturedimage data, as further described herein.

FIG. 2 is a block diagram illustrating depicting exemplary computerhardware and software components of a computing device 200 forprocessing multi-dimensional image data in accordance with one or moreof the disclosed embodiments. The computing device 200 can be arrangedwith various computer hardware and software components that serve toimplement the exemplary methods for analyzing multi-dimensional imagedata of a surface to selectively detect features. For example andwithout limitation, in a more specific exemplary implementation furtherdescribed herein, the computing device can be configured to performoperations relating to the analysis of the image data informationcaptured by the imaging device 100 for the purpose of detecting salientfeatures of the inspected structure (e.g., deformation).

As shown in FIG. 2, components of the computing device 200 include aprocessor 240 and a circuit board 250. As shown in FIG. 2, the circuitboard can include a memory 255, a communication interface 260 and acomputer readable storage medium 265 that are accessible by theprocessor 240. The processor 240 and/or circuit board 250 can also becoupled to a display 270, for visually outputting information to anoperator (user), a user interface 275 for receiving operator inputs, andan audio output 280 for providing audio feedback as would be understoodby those in the art. As an example, the apparatus 200 could emit avisual signal from the display 270, for instance, the image of a surfacecaptured using the inspection apparatus 100 or a processed image of thesurface depicting particular features detected according to theexemplary image processing algorithms further described herein. Althoughthe various components are depicted either independent from, or part ofthe circuit board 250, it can be appreciated that the components can bearranged in various configurations.

The processor 240 serves to execute software instructions that can beloaded into the memory. The processor 240 can be implemented usingmultiple processors, a multi-processor core, or some other type ofprocessor. The memory 255 is accessible by the processor 240, therebyenabling the processor to receive and execute instructions stored on thememory and/or on the storage. Memory 255 can be implemented using, forexample, a random access memory (RAM) or any other suitable volatile ornon-volatile computer readable storage medium. In addition, memory 255can be fixed or removable. The storage medium 265 can also take variousforms, depending on the particular implementation. For example, storagemedium 265 can contain one or more components or devices such as a harddrive, a flash memory, a rewritable optical disk, a rewritable magnetictape, or some combination of the above. The storage medium 265 also canbe fixed or removable or remote such as cloud based data storage systems(remote memory or storage configuration not shown). The board 250 canalso include or be coupled to a power source (not shown) source forpowering the computing device.

One or more software modules 285 are encoded in the memory 255 and/orstorage medium 265. The software modules can comprise one or moresoftware programs or applications having computer program code or a setof instructions executed in the processor 240. Such computer programcode or instructions for carrying out operations and implementingaspects of the systems and methods disclosed herein can be written inany combination of one or more programming languages. While softwaremodules are stored locally in storage 265 or memory 255 and executelocally in the processor 240, the processor can interact withremotely-based computing platform, preferably wirelessly viacommunication interface 260, and via a local or wide area network toperform calculations or analysis.

During execution of the software modules 285, the processor 240 isconfigured to perform various operations relating to the analysis of themulti-dimensional image data, as will be described in greater detailbelow. The software modules can include, for example and withoutlimitation: a surface dividing module 290, which configures theprocessor to divide the surface-image data into a number of discretesurfaces; a feature detection module 292, which configures the processorto analyze the feature data within the discrete surfaces and toextrapolate, isolate, highlight and quantify specific features withinthe surface-image data; an image generation module 294, which configuresthe processor to generate a processed image representing the surface andhighlighting detected features for output via a display 270; and acommunication module 296, which configures the processor to communicatewith remote devices (e.g., the inspection device 100) over acommunication connection (not shown) such as a communication network orany wired or wireless electronic communication connection.

The program code of the software modules 285 and one or more of thenon-transitory computer readable storage devices (such as the memory 255and/or the storage 265) can form a computer program product that can bemanufactured and/or distributed in accordance with the presentdisclosure, as is known to those of ordinary skill in the art. Inaddition, information and/or data relevant to the configuration andoperation of the present apparatuses and methods can also be stored inassociation with the software modules. Such information can includeprescribed settings and parameters relating to the multi-dimensionalimage data, known characteristics of the structures and objectsrepresented by the multi-dimensional image data (e.g., the expectedcharacteristics of photonic materials that can be inspected such asexpected diffraction patterns), and characteristics of features to bedetected (e.g., types of material deformation and associatedcharacteristics such as size, shape and the like). Similarly,operational parameters that are specific to the inspection apparatus andfacilitate its operation can also be stored.

FIG. 3 is a systematic flow diagram of a computer implemented method 300for analyzing multi-dimensional image data in order to extrapolate,isolate, highlight and quantify specific features within the image data.In particular, the method 300 is described in the context of processingmulti-dimensional image data of a surface captured through inspection ofthe surface using the inspection device 100.

In the NDT example described herein, the surface material can comprise abuilt-in diffraction grating or other such features having knownperiodicity such that deformation of the inspected structure locallychanges the periodicity of the grating, for instance, by changing thesize of the features and/or the relative distance between the featuresof the grating and, thus, results in a change in the wavelength ofreflected light that is captured by the inspection device 100.

Existing systems and method for recordation and storing of the initialand observed grating pattern in a three-dimensional world, and analyzingsuch data in view of known or expected diffraction characteristics, on apoint-by-point basis, can require significant computational resources.Such systems also typically require measuring and mathematicallyaccounting for specific environmental characteristics and inspectionrelated variables that can impact the measured values (e.g.,temperature, lighting, the distance and orientation of the inspectiondevice relative to the surface, the shape of the surface and the like).The exemplary systems and methods disclosed herein include a particularcombination of steps, which are each performed according to a specificset of rules and parameters, that achieves a more efficient and robustsolution for isolating and quantifying salient features in amulti-dimensional image data set at a high degree of accuracy, precisionand resolution and while also maintaining a relatively high level ofcomputational efficiency. Concomitantly, the processing algorithmsallows for the use of less complex imaging systems and simplifiedinspection processes. Furthermore, through adjustment of the parametersaccording to which the various algorithmic image processing steps areperformed allows the system to be used to detect any number of differenttypes of features within the image data and thereby provides a highlytunable solution that can be used in a wide variety of applications.

Routine 300 starts with step 305, in which the multi-dimensionalsurface-image data is provided at the computing device 200. As noted,the multi-dimensional data set can be received from the inspectiondevice 100 that is used to inspect the surface, record the measured dataand transmit the data set to the computing device. In someimplementations, the computing device can receive image data in the formof a pre-processed image, for example, a surface image 411, asillustrated in FIG. 4B(a).

By way of example and without limitation, the multi-dimensional data canalso be represented in the format of data plot, matrix, or tensor. FIG.4A is an exemplary matrix representation of a multi-dimensional dataset406. The dataset comprises data-points in the number of i. Eachdata-point comprises k dimensions. Both i and k can be any positiveintegers (i, k≥0); i and k are mutually independent. As shown in FIG.4A, a first dimension, “Dimension 1” is represented by the variable “x”and a second dimension, “Dimension 2” is represented by the variable“y.” For example, the sub-dataset (x, y) can represent a two dimensionallocation dataset. For instance, during inspection and capture of theimage data-points, the inspection device 100 can be configured tocollect the two dimensional positioning data (e.g., x and y position)using on-board positioning sensors (not shown). It should be understoodthat alternative two dimensional positioning systems can be used withoutdeparting from the scope of the disclosed embodiments, for instance, apolar coordination system comprising an angle and a distance value canbe used.

Preferably, the multi-dimensional data includes at least one measureddimensional data, “feature data” represented by variable “z.” Forinstance, in the practical NDT example, z can represents a hue value ofthe radiation diffracted by the inspected surface at a given location,as measured using the inspection device 100. As would be understood, themeasured hue value can be directly related to the wavelength of thelight reflected by that particular point on the surface and captured bythe imaging device.

In some exemplary implementations, the multi-dimensional data 306 cancomprise a three-dimensional location dataset (x, y, z), wherein thelocation dataset comprises longitude, latitude and altitude in referenceto a three dimensional Cartesian coordinate system, or a Gauss-Krugercoordinate system and the like. As noted, preferably the measured imagedata includes one or more measured feature values, (e.g., variable d,which represents the hue value measured by the inspection device at thepoint having the three-dimensional location).

At step 310 of routine 300, the surface represented by themulti-dimensional image data is divided into a number of discretesub-regions. More specifically, the processor 240, which is configuredby executing one or more of the software modules, including, preferably,the surface dividing module 290, can divide the surface 311 into aninteger number of parallelogram-shaped planes 312 according to a surfacedividing model. FIG. 4B graphically illustrates a surface 311 (shown aspart (a), at top) represented by the image data. FIG. 4B alsoillustrates the surface, as divided into a number of parallelogramshaped planes, 312 (shown as part (b), middle). In some embodiments, theparallelograms are rectangles, however the parallelograms can also besquare shaped.

In addition, at step 315, each parallelogram of surface 312 can befurther divided into triangles. More specifically, the processor 240,which is configured by executing one or more of the software modules,including, preferably, the surface dividing module 290, can furtherdivide the parallelogram network of surface 412 into two triangles byone of the diagonal lines of a respective parallelogram.

In some embodiments, the processor can be configured to define theparameters of the surface dividing model. For instance, the configuredprocessor can define the number of parallelograms, as well as the sizeand shape of the parallelograms. More specifically, the surface dividingmodel can be defined by the configured processor as a function of thedimensions of the area measured (e.g., the size of the surface and/orits shape).

For example, the network of rectangles can be defined by subdividing theimage, (or more generally the dataset) into an integer number ofrectangles having the same aspect ratio (or multiple aspect ratios) asthe original image (or entire dataset). For example if the imagemeasures 400×300 pixels, it can be divided into 100 rectangles of size40×30 pixels, or into 10,000 rectangles of size 4×3 pixels, etc. If theentire area of the image (or dataset) cannot be covered completely by aninteger number of rectangles (or squares), then approximations, orneglections can be made. FIG. 4B further illustrates an exemplary set ofcontrol points 420 that form the vertices of the parallelogramssubdividing the surface 312.

In addition or alternatively, the configured processor can define themodel to subdivide the image into a network of parallelogram planeshaving a specific number and size as a function of the target resolutionfor the analysis and level of detail of the processed image. Forinstance, the resolution of the parallelogram network, and thus thetriangle network, can be defined as a function of the characteristics offeatures (e.g., size, continuity, etc.) to be isolated and exposedthrough the image analysis by base-plane subtraction. More specifically,as further described herein, a higher number of subdivisions (i.e.,parallelograms) can result in a more detailed “base-plane” image which,when subtracted from the original image, can result in a greater amountof image data (e.g., features) to be smoothened out from the originalimage and highlighting only changes occurring within discreteparallelograms in a resulting processed image. Accordingly, adjustmentof the parameters of the surface dividing model allows the system to beused to selectively isolate and detect features within the image datahaving various types of characteristics making the disclosed embodimentsuseful for a wide variety of inspection applications.

FIG. 4B shows, as an example, a close up conceptual view of a particularparallelogram 414 of surface 412, having vertices 420 a, 420 b, 420 cand 420 d divided into two triangles along solid diagonal line 425. Thedash-dash broken line 427 shows an alternative option for dividing theparallelogram into a triangle plane. Accordingly, the network ofparallelograms that have been subdivided into triangles collectivelyform a triangular plane network, in which each triangle represents aplane of the surface. A triangular network can be an efficient way toprocess surface data because it simulates surface features according totheir spatial relationships, and can use finite number of triangularplanes to simulate any curved surface. In the exemplary implementation,the data-points representing the predefined area of the surface eachhave a measured value z (e.g., a hue value) that represents certainphysical characteristics of the surface being inspected.

FIG. 4C illustrates a subset of triangles generated at step 315 thatdefine the triangle network representation of the surface 412. In theexemplary implementation shown in FIG. 4C, diagonal lines of theparallelograms in the network are parallel to each other, howeveralternative arrangements are possible. In addition, it can beappreciated that, implementations in which the parallelograms arerectangles or squares, result in a network of right-angled triangles, asshown in FIG. 4C. The right-angled triangular network can reduce datastructure redundancy, save storage space, and can improve robustness ofthe surface division and approximation algorithm.

Then at step 320, approximate feature values of respective triangleplanes are calculated. Calculation of feature values for a given planeserves to generate an approximation of the measured feature values forthe portion of the surface represented by the given plane. Inparticular, the processor 240, which is configured by executing one ormore of the software modules, including, preferably, the featuredetection module 292, can calculate an approximate feature values forthe portions of the imaged surface represented by respective triangleplanes. As further described herein, the approximated feature value canbe calculated according to a triangular plane equation.

FIG. 4C illustrates a right angle triangle 430 of the triangular networkdefined at step 315 and the dash-dash broken lines indicate neighboringtriangles also forming part of the triangular network. An approximatedfeature value Z for each of the triangles of the network can becalculated according to the vertices of the triangles, which cancorrespond to measured data-points. It should also be understood thatthe approximated feature value Z can be one or more values, vectorrepresentations or equations representing the measured values or anapproximation thereof. For instance, because a triangle, e.g., triangle430, defines a plane, the equation of the plane can be extrapolated fromthe data-points of its vertices 432 a, 432 b and 432 c, using, forexample and without limitation, the relationship between the featuresgiven as:a=x _(a) ,y _(a) ,z(x _(a) ,y _(a))  Equation 1:b=x _(b) ,y _(b) ,z(x _(b) ,y _(b))  Equation 2:c=x _(c) ,y _(c) ,z(x _(c) ,y _(c))  Equation 3:

$\begin{matrix}{\mspace{79mu}{\overset{\rightarrow}{ab} = \begin{bmatrix}{x_{b} - x_{a}} \\{y_{b} - y_{b}} \\{{z\left( {x_{b},y_{b}} \right)} - {z\left( {x_{a},y_{a}} \right)}}\end{bmatrix}}} & {{Equation}\mspace{14mu} 4} \\{\mspace{79mu}{\overset{\rightarrow}{a\; c} = \begin{bmatrix}{x_{c} - x_{a}} \\{y_{c} - y_{b}} \\{{z\left( {x_{c},y_{c}} \right)} - {z\left( {x_{a},y_{a}} \right)}}\end{bmatrix}}} & {{Equation}\mspace{14mu} 5} \\{{\overset{\rightarrow}{ab} \times \overset{\rightarrow}{a\; c}} = {\begin{bmatrix}{{\left( {y_{b} - y_{a}} \right) \cdot \left( {{z\left( {x_{c},y_{c}} \right)} - {z\left( {x_{a},y_{a}} \right)}} \right)} -} \\{\left( {y_{c} - y_{a}} \right) \cdot \left( {{z\left( {x_{b},y_{b}} \right)} - {z\left( {x_{a},y_{a}} \right)}} \right)} \\{{\left( {{z\left( {x_{b},y_{b}} \right)} - {z\left( {x_{a},y_{a}} \right)}} \right) \cdot \left( {x_{c} - x_{a}} \right)} -} \\\left( {{z\left( {x_{c},y_{c}} \right)} - \left( {{z\left( {x_{a},y_{a}} \right)} \cdot \left( {x_{b} - x_{a}} \right)} \right)} \right. \\{{\left( {x_{b} - x_{a}} \right) \cdot \left( {y_{c} - y_{a}} \right)} - {\left( {x_{c} - x_{a}} \right) \cdot \left( {y_{b} - y_{a}} \right)}}\end{bmatrix} = \begin{bmatrix}A \\B \\C\end{bmatrix}}} & {{Equation}\mspace{14mu} 6}\end{matrix}$

More specifically, in Equation 1, 2, and 3, a, b, and c each representsone vertex of a triangle. Equation 1, for instance, contains locationdata (x_(a), y_(a)) with a measured feature value z(x_(a), y_(a)) ofdata-point 432 a, whereas Equation 2 and Equation 3 have sameinformation in the same data structure of data-points 432 b and 432 c,respectively. While ab and ac are two edges of the triangle, vector{right arrow over (ab)} and {right arrow over (a)}c, as shown inequation 4 and 5, represents two vectors on the same plane. The crossproduct of {right arrow over (ab)} and {right arrow over (ac)}, as shownin equation 6, which is also known in the field of art as “point and anormal” vector, defines a coefficient matrix for the triangle plane in aCartesian coordination system. Collectively, equations 1-6 serve toapproximate individual points of the multi-dimensional data as atriangle plane and the multiple triangular planes together approximatethe multi-dimensional image of the surface. There are approaches otherthan the approach listed above and, as such, equations 1-6 are just oneexample. The plane can be expressed, for example, using the relationshipgiven as:D=A·x _(a) +B·x _(a) +C·z(x _(a) ,y _(a))  Equation 7:The above expression of a three dimensional plane, can be alternativelyexpressed by the following exemplary formula:Ax+By+Cz=D  Equation 8:

Therefore, a feature value of a data-point in a given plane can beapproximated using the plane formula equation. Let Z represents theapproximate feature value of a data-point. In any given triangular planeof the surface data, an approximate Z value can be calculated using aformula transformation as shown in Equation 9, in which we replace z inEquation 8 by Z(x_(i), y_(i)):

$\begin{matrix}{{Z\left( {x_{i},y_{i}} \right)} = \frac{D - {Ax}_{i} + {Bx}_{i}}{C}} & {{Equation}\mspace{14mu} 9}\end{matrix}$

As noted, in the exemplary practical NDT application, the approximate Zvalue can represent hue. Effectively, calculating the approximate Zvalue for each plane serves to generate an approximate representation ofhue value for points within each plane. Furthermore, the contiguousnetwork of so approximated triangle planes serves to generate anapproximate representation of the entire set of surface-image data.

It should be understood that, addition to modulating the size of theindividual planes to adjust the resolution of the image and selectivelyhighlight different types of features, the particular mathematicalalgorithm for approximating the individual planes can also be adjustedaccording to the particular application of the technology.

Then at step 325, adjusted feature values from the original surface dataare generated. Step 325 effectively highlights and isolates salientfeatures of the surface-image at respective locations on the surface. Inparticular, in an exemplary implementation, the processor 240, which isconfigured by executing one or more of the software modules, including,preferably, the feature detection module 292, can calculate the adjustedfeature value V for respective data-points in the surface-image bybaseline/base-plane subtraction. More specifically, the configuredprocessor can subtract the approximated Z value of a respective planefrom the observed z value of each point of the surface-image data sethaving the corresponding x and y coordinates, and such difference isdefined as the adjusted feature value V.

The exemplary mathematic relationship for calculating the adjustedfeature value Z for an individual data-points is shown as in equation10:V=z(x ₁ ,y _(i))−Z(x _(i) ,y _(i))  Equation 10:

It should be appreciated that, in some implementations, the measuredfeature values z represented by the original surface-image data set canbe absolute values (e.g., a measured magnitude) and, as a result ofbaseline subtraction, the adjusted feature value V is relative to theapproximated feature value Z of the corresponding triangle plane. Itshould also be understood that additional processing can be performed tofurther refine the adjusted feature value V for the data-points. Forinstance, the adjusted feature value of hue can be converted based onknown mathematical relationships into a measure of displacement. Inaddition or alternatively, a “tare” operation can be performed in whichwith an expected value (e.g., the expected feature value or displacementcorresponding to an un-deformed structure) can be subtracted from theadjusted feature value calculated by baseline subtraction (e.g., toquantify only the magnitude of the displacement as an absolute value).It should also be understood that additional data treatment andprocessing steps can be performed to further refine the resultingdata-set and/or convert the data into alternative forms or measures.

By way of further example, FIG. 4D graphically illustrates a particulartriangle plane 442 of surface 412, having vertices 440 a, 440 b and 440c represented in three-dimensions and a corresponding two-dimensionalrepresentation 444 of the triangle plane, having vertices 440 a′, 440 b′and 440 c′ determined from three measured data points as describedabove.

FIGS. 5A-5C depict a graphical representation of the exemplary imagedata at various stages of processing according to routine 300. FIG. 5Adepicts an example surface-image data-set 515 comprisingobserved/measured feature values and sub-divided into a network oftriangle planes (e.g., at step 315). FIG. 5B depicts an examplesurface-image data-set 520 comprising approximate feature values forrespective triangle planes, as calculated at step 320. FIG. 5C depicts asurface-image data-set 525 comprising adjusted feature values calculatedby base-plane subtraction of the observed feature values z (as shown inFIG. 5A), overlaid on the approximate feature values Z, as shown in FIG.5B (e.g., at step 325). The adjusted feature values are shown overlaidon top of the sub-divided surface-image of FIG. 5A so as to highlightthe corresponding location of the features presenting in the adjustedfeature value image.

The disclosed exemplary processes for surface-image data analysisprovide a specific approach that includes steps for image-surfacesubdivision and surface approximation followed by base-plane subtractionthat result in salient changes in the measured feature value occurringwithin a particular triangular plane to remain within the resultingadjusted feature value data-set. In addition, changes in the featurevalue occurring over an area that it is greater than the size of anindividual triangle are at least partially smoothed out aftersubtraction. Accordingly, rapid changes (i.e., changes in z that occurwithin a particular triangle plane) are highlighted relative to “slower”changes (e.g., changes extending over a larger area). However, it can beappreciated that, depending on the magnitude of such slower changes,which extend over a larger area, such changes can still present in theresulting adjusted feature value data-set, albeit deemphasized.Accordingly, whether a particular feature is represented in the adjustedfeature value data-set can be a function of both magnitude andsize/area.

Ultimately, base-plane/baseline approximation and then subtractionserves to remove feature values that are generally shared across thesurface and would be represented in the baseline approximation of thesurface image generated at step 320 and subtracted out at step 325.Similarly, as a result of the particular method for surfaceapproximation and baseline subtraction, changes in feature value thatpresent over larger areas, which can commonly result from environmentalor inspection conditions and changes thereof (e.g., the distance orangle of the inspection device relative to the imaged surface duringinspection, lighting conditions, the particular contours of the surface,temperature, and the like) are similarly smoothed out (e.g.,deemphasized) within the final processed data set comprising theadjusted feature-value data set. Thus the particular combination ofsteps result in a robust feature detection process that ismathematically simplified and rendered more efficient, as many changingenvironmental and inspection conditions do not need to be accounted for,and without sacrificing accuracy in detecting and isolating salientfeatures such as material deformation. From a practical standpoint theinspection process is operationally more efficient as well, becausefeature data values can be measured and captured irrespective ofchanging in environmental and inspection conditions.

In regard to the practical NDT application, feature values resultingfrom material deformation typically vary substantially from theapproximated feature values, while feature values (and changes infeature value) that do not correspond to material deformation havemeasured feature values close to the approximated values. Accordingly,the feature values corresponding to material deformation remain in thefinal image data after subtraction of the baseline (i.e., theapproximated feature values of the triangle planes) and are shown in theresulting processed surface-image as abrupt changes. More specifically,the surface deformation can be described as having a “sharp” valuebecause the measured value deviates greatly from the approximated valuefor a respective plane and can presents as a peak in the processedimage. By comparison, measured values resulting from other environmentalchanges (e.g., underlying changes in the shape of the material orvariations in inspection conditions like inspection angle) do notdeviate as significantly from the approximated values.

FIG. 5C illustrates an example of sharp feature value changes thatpersist in the surface-image data after baseline subtraction. As noted,in some cases, a change in feature value does not cross a triangle planeboundary, i.e. remains within or on the boundary of one triangularplane. The peak 550 on the left of FIG. 5C is an example of a sharpvalue not crossing a triangle plane boundary (e.g., a boundary betweenadjacent triangles). In some exemplary implementations, a feature valuechange crosses multiple triangular planes and remains as a sharp featurein the processed image after baseline subtraction. The peak 555 on theright of FIG. 5C is an example of a sharp feature value that crossesmultiple triangular planes. As noted, a sharp change in feature valuethat crosses multiple triangular planes has been, to some degree,smoothed out (e.g., decreased in magnitude) through baselinesubtraction, while the sharp value within a single triangle remainsrelatively unaffected.

In step 330, a processed multi-dimensional image of the surface can begenerated. More specifically, the processor 240, which is configured byexecuting one or more of the software modules, including, preferably,the image generation module 294, can generate a graphical representation(e.g., an image) depicting the surface based on the adjusted featurevalue V of each data-point. As can be appreciated, through generatingthe processed multi-dimensional image of the surface based on theadjusted feature values V of each data-point, the data set defining theprocessed multi-dimensional image of the surface differs from the dataset in the provided image data. FIG. 5D is an exemplary graphicalillustration of a processed multi-dimensional image 530 showing theadjusted feature values V.

By way of further example, FIG. 5E is a three-dimensional graphicalrepresentation of processed surface-image data overlaid on atriangulated graphical representation of surface-image data. Inparticular, FIG. 5E illustrates an alternative example in which adjustedfeature values representing sharp feature value changes persist in thedata set after baseline subtraction and wherein both instances of sharpfeature value changes do not cross a triangle plane boundary (e.g.,remain within or on the boundary of one triangular plane, respectively).FIG. 5F graphically illustrates the processed multi-dimensional image530 showing the adjusted feature values V without being overlaid on thetriangulated map of surface image data.

In some implementations, the processed multi-dimensional image generatedby the processor can contain several layers of information generated atvarious steps of the exemplary routine 300. For instance, as shown inFIG. 5G, the layers of information can include a location data layer575, a triangular network layer 570 illustrating the subdivisions of thesurface image, an original measured feature value layer 580 (e.g., theoriginal surface image illustrating measured value of hue for respectivelocations), and a final surface-image layer 585 generated based on theadjusted feature value. The configured processor output the finalprocessed image and layers together or separately. In addition, theimage that is generated can be formatted as vector data or raster data,as would be understood in the art.

In step 335, one or more image layers including, preferably, theprocessed multi-dimensional image of the surface can be output by theprocessor 240 using the display 270 of computing device 200. Morespecifically, the processor 240 using the display 270 can graphicallyoutput the final processed image to an operator and thereby graphicallypresent features from the original surface-image that correspond tomaterial deformation, as detected and isolated according to steps305-330 of the routine 300. For instance, the graphical output caninclude

Whereas the existing technologies primarily concentrate on averaging,smoothing and isolating features based on frequency and can be furtherlimited in that they require monitoring and mathematically adjusting forchanging environmental and inspection conditions, the foregoingdisclosed embodiments apply a particular set of rules according to aspecific approach that is unconventional in the art and achievespractical benefits in terms of accuracy and processing efficiency, amongother things. More specifically, according to a salient aspect, theprocessed multi-dimensional image generated based on the calculatedadjusted feature values V depicts, in a graphical representation,changes in measured feature values z occurring within a given triangleplane with greater emphasis relative to changes in measured featurevalues z occurring over an area comprising multiple triangle planes.Moreover, benefits achieved by the disclosed systems and methods in theNDT implementation include the ability to identify deformationsirrespective of changes in inspection condition variables, i.e.,lighting, relative orientation of the inspection device and thematerial, distance of the inspection device and the material, etc. As afurther result, the deformation analysis is simplified and moreefficient, not only from a computational point of view, but also from anoperational point of view, as the inspection device does not necessarilyrequire sensors for monitoring inspection conditions (e.g., using aproximity sensor, angle sensor and even specific light sources).

Illustrative embodiments and arrangements of the present systems andmethods provide a system and a computer implemented method, computersystem, and computer program product for analyzing multi-dimensionalsurface image data to, inter alia, detect deformation of the imagedstructure. The flowchart and block diagrams in the figures illustratethe architecture, functionality, and operation of possibleimplementations of systems, methods and computer program productsaccording to various embodiments and arrangements. In this regard, eachblock in the flowchart or block diagrams can represent a module,segment, or portion of code, which comprises one or more executableinstructions for implementing the specified logical function(s). Itshould also be noted that, in some alternative implementations, thefunctions noted in the block can occur out of the order noted in thefigures. For example, two blocks shown in succession can, in fact, beexecuted substantially concurrently, or the blocks can sometimes beexecuted in the reverse order, depending upon the functionalityinvolved. It will also be noted that each block of the block diagramsand/or flowchart illustration, and combinations of blocks in the blockdiagrams and/or flowchart illustration, can be implemented by specialpurpose hardware-based systems that perform the specified functions oracts, or combinations of special purpose hardware and computerinstructions.

It is to be understood that any structural and functional detailsdisclosed herein are not to be interpreted as limiting the systems andmethods, but rather are provided as a representative embodiment and/orarrangement for teaching one skilled in the art one or more ways toimplement the methods.

The subject matter described above is provided by way of illustrationonly and should not be construed as limiting. The terminology usedherein is for the purpose of describing particular embodiments only andis not intended to be limiting of the invention. As used herein, thesingular forms “a”, “an” and “the” are intended to include the pluralforms as well, unless the context clearly indicates otherwise. It willbe further understood that the terms “comprises” and/or “comprising”,when used in this specification, specify the presence of statedfeatures, integers, steps, operations, elements, and/or components, butdo not preclude the presence or addition of one or more other features,integers, steps, operations, elements, components, and/or groupsthereof.

Also, the phraseology and terminology used herein is for the purpose ofdescription and should not be regarded as limiting. The use of“including,” “comprising,” or “having,” “containing,” “involving,” andvariations thereof herein, is meant to encompass the items listedthereafter and equivalents thereof as well as additional items.

While the present invention has been described above using severalspecific examples and embodiments, there are modifications andvariations that will be apparent to those having ordinary skill in theart. As such, the described embodiments are to be considered in allrespects as illustrative, and not restrictive. Therefore, the scope ofthe invention is indicated by the appended claims, rather than by theforegoing description. All changes that come within the meaning andrange of equivalency of the claims are to be embraced within theirscope.

What is claimed is:
 1. A computer implemented method for detectingdeformation of a structure from multi-dimensional image data of asurface of the structure captured with an optical inspection device, themethod comprising: providing the multi-dimensional image data at aprocessor, the image data comprising a plurality of data-points measuredusing the optical inspection device, each data-point including: locationdata identifying, in at least two dimensions, a respective location onthe surface that a respective data-point was captured; and feature valuedata including at least a respective feature value z for the respectivedata-point measured using the inspection device; applying, with theprocessor, a surface dividing model to the image data, including thesteps of: dividing the surface represented by the image data intomultiple parallelogram-shaped planes, and subdividing each of theparallelogram-shaped planes into two triangle planes, respectively;calculating, with the processor, approximate feature values Z for eachof the triangle planes, wherein the approximate feature value for arespective triangle plane is calculated based on the measured featurevalue of one or more of the data-points within the respective triangleplane; calculating, with the processor based on the feature value, anadjusted feature value V for each of the plurality of data-points,wherein the adjusted feature value for a respective data-point iscalculated based on the measured feature value z for the respectivedata-point and the calculated approximate feature value Z for a triangleplane that the respective data-point is within; generating, with theprocessor based on the adjusted feature values V of each data-point, aprocessed multi-dimensional image of the surface in which the data setfor the processed multi-dimensional image differs from the data set inthe provided image data; and outputting, with the processor using agraphical display, the processed multi-dimensional image of the surface,wherein the processed multi-dimensional image depicts in a graphicalrepresentation the detected deformation of the surface within respectivetriangular planes of the subdivided image data.
 2. The method of claim1, wherein the step of calculating the adjusted feature values V forinclusion in the processed multi-dimensional image further comprisesbaseline subtraction of the calculated approximate feature value Z, fora given triangle plane and each of its respective data-points, from themeasured feature value z for each said respective data-point.
 3. Themethod of claim 1, wherein the approximate feature value Z for therespective triangle plane is calculated according to a triangular planeequation and based on measured data-points that correspond to respectivevertices of the respective triangle plane.
 4. The method of claim 1,wherein the processed multi-dimensional image generated based on theadjusted feature values V depicts in a graphical representation changesin measured feature values z occurring within a given triangle planewith greater emphasis relative to changes in measured feature values zoccurring over an area comprising multiple triangle planes.
 5. Themethod of claim 1, further comprising: generating, with the processor,the surface dividing model specifying a number of the multipleparallelogram shaped planes as a function of dimensions of the surfacerepresented by the image data and a size of features corresponding todeformation to be detected from the image data.
 6. The method of claim1, wherein the parallelogram planes are rectangular in shape.
 7. Themethod of claim 1, wherein the triangle planes are right-angled triangleplanes.
 8. The method of claim 1, wherein each parallelogram plane isfurther divided along a diagonal line extending between two verticesthereof, such that the diagonal line defines a shared edge of tworespective triangle planes.
 9. The method of claim 1, wherein the stepof providing comprises: measuring, using the inspection device, theplurality of data-points using the optical inspection device; andgenerating the multi-dimensional image data.
 10. The method of claim 9,wherein the feature value data is a measure of hue of diffractedradiation captured using the inspection device.
 11. The method of claim1, wherein the calculated approximate feature value Z for a respectivetriangle plane is represented as one or more of a value, vector, andequation and is calculated from the measured feature value z of one ormore data-points located within the respective triangle plane.
 12. Themethod of claim 1, wherein the approximate feature value Z for therespective triangle plane is calculated from the measured feature valuez of data-points located at three vertices of the respective triangleplane.
 13. A system for detecting deformation a structure frommulti-dimensional image data of a surface of the structure captured withan optical inspection device, the system comprising: a computer readablestorage medium; a communication interface; a display; one or moreprocessors configured to access the storage medium and in operativecommunication with the communication interface and the display; andsoftware modules stored on the storage medium and executable by theprocessor, wherein the software modules including: a communicationmodule that, when executed by the processor, configures the processorto, using the communication interface, receive the multi-dimensionalimage data including a plurality of data-points measured using theoptical inspection device, the data-points comprising: location dataidentifying, in at least two dimensions, a respective location on thesurface that a respective data-point was captured, and feature valuedata including at least a respective feature value z for the respectivedata-point measured using the inspection device; a surface dividingmodule that, when executed by the processor, configures the processorto, divide the surface represented by the image data into multipleparallelogram-shaped planes according to a surface dividing model andsubdivide each of the parallelogram-shaped planes into two triangleplanes, respectively; a feature detection module that, when executed bythe processor, configures the processor to calculate a respectiveapproximate feature value Z for each of the triangle planes, wherein theapproximate feature value Z for a respective triangle plane iscalculated based on a measured feature value z of one or more of thedata-points within the respective triangle plane, and wherein thefeature detection module further configures the processor to calculatean adjusted feature value V for each of the plurality of data-points,wherein the adjusted feature value V for a respective data-point iscalculated based on the measured feature value z for the respectivedata-point and the calculated approximate feature value Z for a triangleplane that the respective data-point is within; and an image generationmodule that, when executed by the processor, configures the processor togenerate, based on the adjusted feature value V of each data-point, aprocessed multi-dimensional image of the surface in which the data setfor the processed multi-dimensional image differs from the data set inthe received image data, and further configures the processor to outputthe processed multi-dimensional image of the surface using the display,wherein the processed multi-dimensional image depicts in a graphicalrepresentation the detected deformation of the surface within respectivetriangular planes of the surface.
 14. The system of claim 13, whereinthe approximate feature value Z for the respective triangle plane iscalculated according to a triangular plane equation and based onmeasured data-points that correspond to respective vertices of therespective triangle plane.
 15. The system of claim 13, wherein theadjusted feature values V inclusion in the processed multi-dimensionalimage further is calculated by baseline subtraction of the calculatedapproximate feature value Z, for a given triangle plane, from themeasured feature value z for each respective data-point in said giventriangle plane.
 16. The system of claim 13, further comprising: anoptical inspection device configured to measure the plurality ofdata-points and generate the multi-dimensional image data.
 17. Thesystem of claim 13, wherein the surface dividing module furtherconfigures the processor to generate the surface dividing modelspecifying a number of the multiple parallelogram shaped planes as afunction of dimensions of the surface represented by the image data anda size of features corresponding to deformation to be detected from theimage data.